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Advanced Detectors, Systems, & Nanoscience

A close-up view of one of the devices that MDL delivered to RAL. Multiple CMOS arrays were processed for low energy X-ray detection on 8-inch wafers using superlattice doping.

Custom Wafer-Scale CMOS Array for Low-Energy X-Ray Detector Development in Partnership with Rutherford Appleton Laboratory

A partnership has commenced between Rutherford Appleton Laboratory (RAL) in Oxford, England, and the MDL to develop wafer-scale complementary metal-oxide-semiconductor (CMOS) arrays for low-energy X-ray detection. Although the intended use of this detector development is for a synchrotron, this low energy X-ray detector can be used for instruments in future missions.

In the first phase of work, MDL worked with smaller-scale arrays to establish proof of concept. This first set of detectors has been delivered to RAL for testing and feedback. The wafer-scale design is completed and will be processed in the second phase of the project, expected in 2014.

 

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